9

Reliability and failure in single crystal silicon MEMS devices

Year:
2008
Language:
english
File:
PDF, 571 KB
english, 2008
12

Ternary TaSiN films for sensors and actuators

Year:
1997
Language:
english
File:
PDF, 885 KB
english, 1997
13

Internal stresses and lifetime evaluation of PECVD isolating layers

Year:
2001
Language:
english
File:
PDF, 159 KB
english, 2001
16

Analysis of etched cantilevers

Year:
2002
File:
PDF, 1.40 MB
2002
17

The crystal structure of ZnP4

Year:
1989
Language:
english
File:
PDF, 337 KB
english, 1989
21

Reden wir über Geld! Aber wie? Und wozu?

Year:
2011
Language:
german
File:
PDF, 103 KB
german, 2011
22

Was ist die Wirtschaft? Und woran würde man sie erkennen?

Year:
2011
Language:
german
File:
PDF, 98 KB
german, 2011
31

The Role of Strain in New Semiconductor Devices

Year:
2009
Language:
english
File:
PDF, 398 KB
english, 2009
35

On the crystal structure of UPt

Year:
1988
Language:
english
File:
PDF, 172 KB
english, 1988
36

Low-temperature properties of U14Au51

Year:
1989
Language:
english
File:
PDF, 315 KB
english, 1989
37

Encephalitis in a 13-year-old boy following 17D yellow fever vaccine

Year:
1990
Language:
english
File:
PDF, 137 KB
english, 1990
43

The magnetic and nuclear structure of UPt

Year:
1989
Language:
english
File:
PDF, 335 KB
english, 1989
44

Aging of MEMS – Correlation of Mechanical and Structural Properties

Year:
2009
Language:
english
File:
PDF, 779 KB
english, 2009
48

The crystal structure of BiFe(CN)6·4H2O and BiCo(CN)6·4H2O

Year:
1990
Language:
english
File:
PDF, 395 KB
english, 1990